|本期目录/Table of Contents|

[1]刘沛龙,常亮,陈宏宇,等.星载计算机SRAM单粒子微闩锁检测方法[J].天津大学学报(自然科学版),2017,(08):856-861.[doi:10.11784/tdxbz201605106]
 Liu Peilong,Chang Liang,Chen Hongyu,et al.Detection of SRAM mSEL in Onboard Computers of Satellite[J].Journal of Tianjin University,2017,(08):856-861.[doi:10.11784/tdxbz201605106]
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星载计算机SRAM单粒子微闩锁检测方法()
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《天津大学学报(自然科学版)》[ISSN:0493-2137/CN:12-1127/N]

卷:
期数:
2017年08
页码:
856-861
栏目:
电气自动化与信息工程
出版日期:
2017-08-31

文章信息/Info

Title:
Detection of SRAM mSEL in Onboard Computers of Satellite
文章编号:
0493-2137(2017)08-0856-06
作者:
刘沛龙123 常亮2 陈宏宇2 谭竹慧123
1. 中国科学院上海微系统与信息技术研究所,上海 200050;2. 上海微小卫星工程中心,上海 201203;3. 中国科学院大学,北京 101407
Author(s):
Liu Peilong123 Chang Liang2 Chen Hongyu2 Tan Zhuhui123
1.Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Science, Shanghai 200050, China
2.Shanghai Engineering Center for Microsatellites, Shanghai 201203, China
3.University of Chinese Academy of Sciences, Beijing 101407,
关键词:
星载计算机 SRAM 闩锁 微闩锁 单粒子微闩锁
Keywords:
onboard computer SRAM latch-up micro latch-up micro-SEL
分类号:
TN911.21
DOI:
10.11784/tdxbz201605106
文献标志码:
A
摘要:
静态随机存储器(SRAM)的单粒子微闩锁(mSEL)现象可能引起星载计算机运行崩溃, 威胁整星运行安全.传统的闩锁电流检测方法难以发现mSEL, 国内外研究成果至今没有给出令人满意的具体可行的星上mSEL检测方案, 也没有航天工程应用实例.根据SRAM发生mSEL时的错误簇现象, 设计了基于EDAC编解码的mSEL检测方案, 介绍了软硬件架构, 提出了两种检测策略并研究讨论了其性能.其中遍寻策略实现简单、性能稳定, 随机搜索策略实现开销大, 在某些场景中90% 检出率的要求下, 检测速度达到遍寻策略的8.5倍.本文提出的方法能够提高空间应用中SRAM器件可靠性, 降低由mSEL引发的系统失效概率.
Abstract:
Micro-SEL(mSEL)of SRAM may collapse onboard computers and threaten the safe operation of the whole satellite. Traditional methods based on latch-up current detection can hardly detect mSEL. So far there is no satisfactory and feasible onboard mSEL detection scheme,nor examples of aerospace engineering application. On the basis of error cluster phenomenon when mSEL occurs in SRAM,a detection scheme based on EDAC detection method was designed,the hardware and software architectures were introduced,and sequential and random searching strategies were proposed. Simulation results show that sequential searching is simple and stable,while the high-cost random process is 8.5 times faster in some cases with a successful detection rate of 90% . The proposed method can improve reliability of SRAM devices embedded in satellite and reduce system invalidation probability caused by the mSEL of SRAM efficiently.

参考文献/References:

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备注/Memo

备注/Memo:
收稿日期: 2016-05-31; 修回日期: 2017-03-06.
作者简介: 刘沛龙(1989—), 男, 博士研究生.
通讯作者: 刘沛龙, plliu@tju.edu.cn.
更新日期/Last Update: 2017-08-10