|本期目录/Table of Contents|

 跨尺度微小型零件的测量与装配(PDF)

《纳米技术与精密工程》[ISSN:1672-6030/CN:12-1351/O3]

期数:
2012年4期
页码:
342-347
栏目:
精密测量
出版日期:
2012-07-15

文章信息/Info

Title:
 Measurement and Assembly of Trans-Scale Miniature Parts
作者:
 张习文1 王晓东1 罗怡1 滕霖2 王小斌2
 (1. 大连理工大学微纳米技术及系统辽宁省重点实验室, 大连116024;
2. 中国航空工业集团公司西安飞行自动控制研究所, 西安710065 )
Author(s):
 ZHANG Xiwen1 WANG Xiaodong1 LUO Yi1 TENG Lin2 WANG Xiaobin2
 (1. Key Laboratory for Micro/Nano Technology and System of Liaoning Province, Dalian University of Technology,Dalian 116024, China;
2. Flight Automatic Control Research Institute, Aviation Industry Corporation of China, Xi’an 710065, China)
关键词:
 跨尺度零件 位姿检测 显微视觉 自动装配 局部特征拼接法
Keywords:
 trans-scale devices position and orientation measurement micro-vision automatic assembly local feature splicing method
分类号:
-
DOI:
-
文献标识码:
A
摘要:
 针对跨尺度微小型零件的精密装配中显微视觉视场狭小与零件的特征尺寸跨度较大相矛盾的问题,研究了跨尺度零件的位姿检测技术,基于高、低倍显微视觉单元研制了自动装配系统,系统采用模块化体系结构及先看后动的装配控制模式.提出局部特征拼接法实现了跨尺度零件的定位测量,使用标定尺对系统坐标系之间的误差角进行了标定,采用参考基准法辅助对显微视觉单元切换后的装配基准进行定位.设计测试模板对系统测量精度进行了验证,结果显示高倍显微视觉单元的同轴度测量精度优于1郾5 μm,平行度精度优于1 μm.利用研制的装配系统进行了装配实验,实验结果表明,关键零件的装配精度满足工艺要求.该装配系统可稳定、可靠地完成跨尺度微小型零件的自动装配.
Abstract:
To solve the contradiction between small field-of-view of micro-vision and large span of part feature dimension in the precise assembly of trans-scale miniature devices position and orientation measurement technology for the precise assembly of trans-scale miniature parts was investigated and the automatic assembly system based on high and low magnification micro-vision units was developed. The modular architecture and the look-and-move control pattern were adopted by the assembly system. The local feature splicing method was introduced for measuring the position and orientation of trans-scale parts. Installation angle errors between the coordinate frames of the assembly system were calibrated by the calibration tools. The reference datum method was applied to assist in locating the assembly reference after the micro-vision units were switched. The test template was used to verify the system measurement accuracy and the results show that the system coaxiality measurement error of high magnification imaging unit was less than 1~5 μ m and the parallelism measurement error was less than 1 μ m. Assembly experiment was carried out by the developed system and the results show that assembly accuracy requirements can be met. The automatic assembly of trans-scale miniature devices can be steadily and reliably realized by the assembly system.

参考文献/References

备注/Memo

备注/Memo:
更新日期/Last Update: 2012-11-14